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Experimental techniques for low-temperature measurements : cryostat design, material properties, and superconductor critical-current testing

フォーマット:
図書
責任表示:
Jack W. Ekin
言語:
英語
出版情報:
New York : Oxford University Press, 2006
形態:
xxviii, 673 p. ; 26 cm
著者名:
Ekin, Jack. W.  
書誌ID:
BA79313513
ISBN:
9780198570547 [0198570546] (alk. paper)  CiNii Books  Webcat Plus  Google Books
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