Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China

Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China / Shenghua Ye, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering, COEMA--China Optics & Optoelectronic Manufacturers Association, COS--Chinese Optical Society ; cooperating organizations, National Natural Science Foundation of China ... [et al.]
(Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3558)

配架場所	巻　次	請求記号	登録番号	状　態	利用注記	予約
1F図書		A9/SP/3558	9932483

出版情報	Bellingham, Washington : SPIE , c1998
本文言語	英語
大きさ	xiii, 656 p. : ill. ; 28 cm
一般注記	Includes bibliographical references and author index
著者標目	Yeh, Sheng-hua, 1934- Society of Photo-optical Instrumentation Engineers Chinese Optical Society Chinese Optics & Optoelectronic Manufacturers Association
件　名	LCSH:Engineering inspection -- Automation -- Congresses 全ての件名で検索 LCSH:Quality control -- Optical methods -- Automation -- Congresses 全ての件名で検索 LCSH:Optical detectors -- Industrial applications -- Congresses 全ての件名で検索 LCSH:Optical measurements -- Congresses 全ての件名で検索
分　類	LCC:TS156.2 DC21:670.42/5
ISBN	0819430196
NCID	BA45606215