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Surface scattering and diffraction for advanced metrology II : 9 July 2002 Seattle, Washington, USA / Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations the Boeing Company (USA) ... [et al.]
(Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4780)
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| 配架場所 | 巻 次 | 請求記号 | 登録番号 | 状 態 | 利用注記 | 予約 |
|---|---|---|---|---|---|---|
| 1F図書 |
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A9/SP/4780 | 10030047 |
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書誌詳細を非表示
| 出版情報 | Bellingham, Wash. : SPIE , c2002 |
|---|---|
| 本文言語 | 英語 |
| 大きさ | vii, 186 p. : ill. ; 28 cm |
| 一般注記 | Includes index |
| 著者標目 | Society of Photo-optical Instrumentation Engineers Gu, Zu-Han Maradudin, A. A. |
| ISBN | 0819445479 |
| NCID | BA6196980X |