Ultraviolet and x-ray detection, spectroscopy and polarimetry III : 19-20 July 1999, Denver, Colorado

Ultraviolet and x-ray detection, spectroscopy and polarimetry III : 19-20 July 1999, Denver, Colorado / Silvano Fineschi, Bruce E. Woodgate, Randy A. Kimble, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
(Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3764)

配架場所	巻　次	請求記号	登録番号	状　態	利用注記	予約
1F図書		A9/SP/3764	9932533

出版情報	Bellingham, Wash. : SPIE , c1999
本文言語	英語
大きさ	vii, 288 p. : ill. ; 28 cm
一般注記	Includes bibliographical references and index
著者標目	Fineschi, Silvano Woodgate, Bruce Kimble, Randy Alan Society of Photo-optical Instrumentation Engineers
件　名	LCSH:Polarimetry -- Congresses 全ての件名で検索 LCSH:X-ray astronomy -- Instruments -- Congresses 全ての件名で検索 LCSH:Ultraviolet astronomy -- Instruments -- Congresses 全ての件名で検索
分　類	LCC:QB468 DC20:522/.65
ISBN	0819432504
NCID	BA45717599