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v. 157
Optics of charged particle analyzers / Mikhail Yavor
Amsterdam ; Tokyo : Elsevier , 2009
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| 2 |
v. 121, 122
Electron microscopy and holography / ed. by Peter W. Hawkes
[1],2. - San Diego : Academic Press , c2002
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| 3 |
v. 172, 173
Neutron and X-ray microscopy / by Jay Theodore Cremer, Jr
pt. 1,pt. 2. - Amsterdam : Academic Press , 2012
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| 4 |
v. 116
Numerical field calculation for charged particle optics / Erwin Kasper
San Diego : Academic Press , c2001
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| 5 |
v. 184
Time-resolved electron diffraction : for chemistry, biology and materials science / Anatoli A. Ischenko, Sergei A. Aseyev
Amsterdam : Academic Press , 2014
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| 6 |
v. 133
Sir Charles Oatley and the scanning electron microscope / edited by Bernard C. Breton, Dennis McMullan, Kenneth C.A. Smith
San Diego : Academic Press , c2004
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| 7 |
v. 137
Dogma of the continuum and the calculus of finite differences in quantum physics / Henning F. Harmuth, Beate Meffert
San Diego : Elsevier Academic Press , 2005
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| 8 |
v. 174
Silicon-based millimeter-wave technology : measurement, modeling and applications / guest editor, M. Jamal Deen
Amsterdam : Academic Press , 2012
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| 9 |
v. 180
Aspects of streak image tube photography / Mikhail Ya. Schelev ... [et al.]
Amsterdam : Academic Press , 2013
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| 10 |
v. 108
Modern map methods in particle beam physics / Martin Berz
San Diego : Academic Press , c1999
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| 11 |
v. 189
The leptonic magnetic monopole : theory and experiments / Georges Lochak, Harald Stumpf ; editor-in-chief, Peter W. Hawkes
Amsterdam ; Tokyo : Academic Press , 2015
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| 12 |
v. 194
Particles and waves in electron optics and microscopy / Giulio Pozzi
Amsterdam : Academic Press, Elsevier , 2016
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| 13 |
v. 195
Logarithmic image processing : theory and applications / Michel Jourlin
Amsterdam : Academic Press, Elsevier , 2016
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| 14 |
v. 192
Analytical, approximate-analytical and numerical methods in the design of energy analyzers / Victor S. Gurov, Arman O. Saulebekov, Andrey A. Trubitsyn ; translated by Mikhail A. Monastyrskiy
Amsterdam ; Tokyo : Academic Press , 2015
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| 15 |
v. 143
Electron-beam-induced nanometer-scale deposition / edited by Natalia Silvis-Cividjian, Cornelis W. Hagen
Amsterdam ; Tokyo : Elsevier Academic Press , c2006
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| 16 |
v. 159
Cold field emission and the scanning transmission electron microscope / edited by Peter W. Hawkes
Amsterdam ; Tokyo : Elsevier Academic Press , 2009
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| 17 |
v. 155
Selected problems of computational charged particle optics / Dmitry Greenfield and Mikhail Monastyrskiy
Amsterdam ; Tokyo : Elsevier Academic Press , 2009
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| 18 |
v. 149
Electron emission physics / by Kevin L. Jensen
Amsterdam ; Tokyo : Elsevier Academic Press , c2007
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| 19 |
v. 153
Aberration-corrected electron microscopy / edited by Peter W. Hawkes
Amsterdam ; Tokyo : Elsevier Academic Press , 2008
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| 20 |
v. 96
The growth of electron microscopy / edited by Tom Mulvey
San Diego : Academic Press , c1996
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| 21 |
v. 176
The Wien filter / Katsushige Tsuno, Damaschin Ioanoviciu
Amsterdam : Academic Press , c2013
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| 22 |
v. 154
Dirac's difference equation and the physics of finite differences / Henning F. Harmuth, Beate Meffert
Amsterdam : Academic Press, an imprint of Elsevier , 2008
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| 23 |
v. 214
Computer techniques for image processing in electron microscopy / edited by Martin Hÿtch and Peter W. Hawkes
London : Academic Press , 2020
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| 24 |
v. 216
Morphological image operators / edited by Martin Hÿtch and Peter W. Hawkes
London : Academic Press, an imprint of Elsevier , c2020
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