この文献を取り寄せる

この情報を出力する

このページのリンク

他の検索サイト

Advances in imaging and electron physics / edited by Peter W. Hawkes

所蔵情報を非表示

1F図書 204 S4/AE/204 10170205


1F図書 v. 119 S4/AE/119 10010978


1F図書 v. 90 S4/AE/90 9935946


1F図書 v. 91 S4/AE/91 9935947


1F図書 v. 92 S4/AE/92 9935948


1F図書 v. 93 S4/AE/93 9924003


1F図書 v. 94 S4/AE/94 9924257


1F図書 v. 95 S4/AE/95 9924566


1F図書 v. 97 S4/AE/97 9925001


1F図書 v. 98 S4/AE/98 9925067


1F図書 v. 99 S4/AE/99 9922084


1F図書 v. 100, partial cumulative index S4/AE/100 9922215


1F図書 v. 101 S4/AE/101 9922085


1F図書 v. 102 S4/AE/102 9922086


1F図書 v. 103 S4/AE/103 9926407


1F図書 v. 104 : cumulative index S4/AE/104 9928000


1F図書 v. 105 S4/AE/105 9928665


1F図書 v. 106 S4/AE/106 9929712


1F図書 v. 109 S4/AE/109 9932002


1F図書 v. 110 S4/AE/110 9932003


1F図書 v. 111 S4/AE/111 9932004


1F図書 v. 112 S4/AE/112 9932882


1F図書 v. 113 S4/AE/113 9932772


1F図書 v. 114 S4/AE/114 9932950


1F図書 v. 115 S4/AE/115 9933310


1F図書 v. 117 S4/AE/117 10010176


1F図書 v. 118 S4/AE/118 10010977


1F図書 v. 120 S4/AE/120 10020094


1F図書 v. 123 S4/AE/123 10020804


1F図書 v. 124 S4/AE/124 10020805


1F図書 v. 125 S4/AE/125 10020947


1F図書 v. 126 S4/AE/126 10030626


1F図書 v. 127 S4/AE/127 10030730


1F図書 v. 128 S4/AE/128 10031035


1F図書 v. 129 S4/AE/129 10031152


1F図書 v. 130 S4/AE/130 10040618


1F図書 v. 131 S4/AE/131 10040532


1F図書 v. 132 S4/AE/132 10040633


1F図書 v. 134 S4/AE/134 10050096


1F図書 v. 135 S4/AE/135 10050699


1F図書 v. 136 S4/AE/136 10050152


1F図書 v. 138 S4/AE/138 10051114


1F図書 v. 139 S4/AE/139 10060083


1F図書 v. 140 S4/AE/140 10060039


1F図書 v. 141 S4/AE/141 10060084


1F図書 v. 142 S4/AE/142 10060098


1F図書 v. 144 S4/AE/144 10060870


1F図書 v. 145 S4/AE/145 10070005


1F図書 v. 146 S4/AE/146 10070028


1F図書 v. 147 S4/AE/147 10070255


1F図書 v. 148 S4/AE/148 10070299


1F図書 v. 150 S4/AE/150 10080017


1F図書 v. 150 S4/AE/150 10120192


1F図書 v. 151 S4/AE/151 10080023


1F図書 v. 152 S4/AE/152 10080614


1F図書 v. 156 S4/AE/156 10090001


1F図書 v. 158 S4/AE/158 10090283


1F図書 v. 160 S4/AE/160 10100006


1F図書 v. 161 S4/AE/161 10100005


1F図書 v. 162 S4/AE/162 10100520


1F図書 v. 163 S4/AE/163 10100646


1F図書 v. 164 S4/AE/164 10100837


1F図書 v. 165 S4/AE/165 10110003


1F図書 v. 166 S4/AE/166 10110451


1F図書 v. 167 S4/AE/167 10110468


1F図書 v. 168 S4/AE/168 10110469


1F図書 v. 169 S4/AE/169 10110526


1F図書 v. 170 S4/AE/170 10110613


1F図書 v. 171 S4/AE/171 10120123


1F図書 v. 175 S4/AE/175 10130016


1F図書 v. 177 S4/AE/177 10130180


1F図書 v. 178 S4/AE/178 10130181


1F図書 v. 179 S4/AE/179 10130191


1F図書 v. 181 S4/AE/181 10130588


1F図書 v. 182 S4/AE/182 10130613


1F図書 v. 183 S4/AE/183 10140013


1F図書 v. 185 S4/AE/185 10140108


1F図書 v. 186 S0/AE/186 10140805


1F図書 v. 187 S4/AE/187 10140795


1F図書 v. 188 S4/AE/188 10150070


1F図書 v. 190 S4/AE/190 10150092


1F図書 v. 191 S4/AE/191 10150121


1F図書 v. 193 S4/AE/193 10150445


1F図書 v. 196 S4/AE/196 10160204


1F図書 v. 197 S4/AE/197 10160206


1F図書 v. 198 S4/AE/198 10160213


1F図書 v. 199 S4/AE/199 10170023


1F図書 v. 200 S4/AE/200 10170132


1F図書 v. 201 S4/AE/201 10170197


1F図書 v. 202 S4/AE/202 10170192


1F図書 v. 203 S4/AE/203 10170195


1F図書 v. 205 S4/AE/205 10180038


1F図書 v. 206 S4/AE/206 10180042


1F図書 v. 207 S4/AE/207 10180046


1F図書 v. 208 S4/AE/208 10180162


1F図書 v. 209 S4/AE/209 10190059


1F図書 v. 210 S4/AE/210 10190116


1F図書 v. 211 S4/AE/211 10190172


1F図書 v. 212 S4/AE/212 10190488


1F図書 v. 213 S4/AE/213 10200007


子書誌情報を非表示

1 v. 157 Optics of charged particle analyzers / Mikhail Yavor Amsterdam ; Tokyo : Elsevier , 2009
2 v. 121, 122 Electron microscopy and holography / ed. by Peter W. Hawkes [1],2. - San Diego : Academic Press , c2002
3 v. 172, 173 Neutron and X-ray microscopy / by Jay Theodore Cremer, Jr pt. 1,pt. 2. - Amsterdam : Academic Press , 2012
4 v. 116 Numerical field calculation for charged particle optics / Erwin Kasper San Diego : Academic Press , c2001
5 v. 184 Time-resolved electron diffraction : for chemistry, biology and materials science / Anatoli A. Ischenko, Sergei A. Aseyev Amsterdam : Academic Press , 2014
6 v. 133 Sir Charles Oatley and the scanning electron microscope / edited by Bernard C. Breton, Dennis McMullan, Kenneth C.A. Smith San Diego : Academic Press , c2004
7 v. 137 Dogma of the continuum and the calculus of finite differences in quantum physics / Henning F. Harmuth, Beate Meffert San Diego : Elsevier Academic Press , 2005
8 v. 174 Silicon-based millimeter-wave technology : measurement, modeling and applications / guest editor, M. Jamal Deen Amsterdam : Academic Press , 2012
9 v. 180 Aspects of streak image tube photography / Mikhail Ya. Schelev ... [et al.] Amsterdam : Academic Press , 2013
10 v. 108 Modern map methods in particle beam physics / Martin Berz San Diego : Academic Press , c1999
11 v. 189 The leptonic magnetic monopole : theory and experiments / Georges Lochak, Harald Stumpf ; editor-in-chief, Peter W. Hawkes Amsterdam ; Tokyo : Academic Press , 2015
12 v. 194 Particles and waves in electron optics and microscopy / Giulio Pozzi Amsterdam : Academic Press, Elsevier , 2016
13 v. 195 Logarithmic image processing : theory and applications / Michel Jourlin Amsterdam : Academic Press, Elsevier , 2016
14 v. 192 Analytical, approximate-analytical and numerical methods in the design of energy analyzers / Victor S. Gurov, Arman O. Saulebekov, Andrey A. Trubitsyn ; translated by Mikhail A. Monastyrskiy Amsterdam ; Tokyo : Academic Press , 2015
15 v. 143 Electron-beam-induced nanometer-scale deposition / edited by Natalia Silvis-Cividjian, Cornelis W. Hagen Amsterdam ; Tokyo : Elsevier Academic Press , c2006
16 v. 159 Cold field emission and the scanning transmission electron microscope / edited by Peter W. Hawkes Amsterdam ; Tokyo : Elsevier Academic Press , 2009
17 v. 155 Selected problems of computational charged particle optics / Dmitry Greenfield and Mikhail Monastyrskiy Amsterdam ; Tokyo : Elsevier Academic Press , 2009
18 v. 149 Electron emission physics / by Kevin L. Jensen Amsterdam ; Tokyo : Elsevier Academic Press , c2007
19 v. 153 Aberration-corrected electron microscopy / edited by Peter W. Hawkes Amsterdam ; Tokyo : Elsevier Academic Press , 2008
20 v. 96 The growth of electron microscopy / edited by Tom Mulvey San Diego : Academic Press , c1996
21 v. 176 The Wien filter / Katsushige Tsuno, Damaschin Ioanoviciu Amsterdam : Academic Press , c2013
22 v. 154 Dirac's difference equation and the physics of finite differences / Henning F. Harmuth, Beate Meffert Amsterdam : Academic Press, an imprint of Elsevier , 2008
23 v. 214 Computer techniques for image processing in electron microscopy / edited by Martin Hÿtch and Peter W. Hawkes London : Academic Press , 2020
24 v. 216 Morphological image operators / edited by Martin Hÿtch and Peter W. Hawkes London : Academic Press, an imprint of Elsevier , c2020

書誌詳細を非表示

出版情報 San Diego ; Tokyo : Academic Press , 1995-
本文言語 英語
大きさ v. : ill. (some col.) ; 24 cm
別書名 その他のタイトル:Advances in imaging and electron physics including proceedings CPO-10
一般注記 -v.89: Advances in electronics and electron physics
子書誌あり
v.128- published by Elsevier
Includes bibliographical references and index
v. 210-212: edited by Peter W. Hawkes and Martin Hÿtch
v. 212: including proceedings CPO-10
著者標目  Hawkes, P. W. (Peter William), 1937-
Hÿtch, Martin
ISBN 0120147327
NCID BA24211536
巻冊次 v. 90 ; ISBN:0120147327
v. 91 ; ISBN:0120147335
v. 92 ; ISBN:0120147343
v. 93 ; ISBN:0120147351
v. 94 ; ISBN:012014736X
v. 95 ; ISBN:0120147378
v. 97 ; ISBN:0120147394
v. 98 ; ISBN:0120147408
v. 99 ; ISBN:0120147416
v. 100, partial cumulative index ; ISBN:0120147424
v. 101 ; ISBN:0120147432
v. 102 ; ISBN:0120147440
v. 103 ; ISBN:0120147459
v. 104 : cumulative index ; ISBN:0120147467
v. 105 ; ISBN:0120147475
v. 106 ; ISBN:0120147483
v. 107 ; ISBN:0120147491
v. 109 ; ISBN:0120147513
v. 110 ; ISBN:0120147521
v. 111 ; ISBN:012014753X
v. 112 ; ISBN:0120147548
v. 113 ; ISBN:0120147556
v. 114 ; ISBN:0120147564
v. 115 ; ISBN:0120147572
v. 117 ; ISBN:0120147599
v. 118 ; ISBN:0120147602
v. 120 ; ISBN:0120147629
v. 122 ; ISBN:0120147645
v. 123 ; ISBN:0120147653
v. 124 ; ISBN:0120147661
v. 125 ; ISBN:012014767X
v. 126 ; ISBN:0120147688
v. 127 ; ISBN:0120147696
v. 128 ; ISBN:012014770X
v. 129 ; ISBN:0120147718
v. 130 ; ISBN:0120147726
v. 131 ; ISBN:0120147734
v. 132 ; ISBN:0120147742
v. 134 ; ISBN:0120147769
v. 135 ; ISBN:0120147777
v. 136 ; ISBN:0120147785
v. 138 ; ISBN:0120147807 ; XISBN:9780120147809
v. 139 ; ISBN:0120147815 ; XISBN:9780120147816
v. 140 ; ISBN:0120147823 ; XISBN:9780120147823
v. 141 ; ISBN:0120147831 ; XISBN:9780120147830
v. 142 ; ISBN:012014784X ; XISBN:9780120147847
v. 144 ; ISBN:0120147866 ; XISBN:9780120147861
v. 145 ; ISBN:0123739071 ; XISBN:9780123739070
v. 146 ; ISBN:012373908X ; XISBN:9780123739087
v. 147 ; ISBN:9780123739094 ; XISBN:0123739098
v. 148 ; ISBN:9780123739100 ; XISBN:012373908X
v. 150 ; ISBN:9780123742179
v. 151 ; ISBN:9780123742186
v. 152 ; ISBN:9780123742193
v. 156 ; ISBN:9780123747624
v. 158 ; ISBN:9780123747693
v. 160 ; ISBN:9780123810175
v. 161 ; ISBN:9780123813183
v. 162 ; ISBN:9780123813169
v. 163 ; ISBN:9780123813145
v. 164 ; ISBN:9780123813121
v. 165 ; ISBN:9780123858610
v. 166 ; ISBN:9780123813107
v. 167 ; ISBN:9780123859853
v. 168 ; ISBN:9780123859839
v. 169 ; ISBN:9780123859815
v. 170 ; ISBN:9780123943965
v. 171 ; ISBN:9780123942975
v. 175 ; ISBN:9780124076709
v. 176 ; ISBN:9780124081420
v. 177 ; ISBN:9780124077027
v. 178 ; ISBN:9780124077010
v. 179 ; ISBN:9780124077003
v. 180 ; ISBN:9780124077553
v. 181 ; ISBN:9780128000915
v. 182 ; ISBN:9780128001462
v. 183 ; ISBN:9780128002650
v. 184 ; ISBN:9780128001455
v. 185 ; ISBN:9780128001448
v. 186 ; ISBN:9780128002643
v. 187 ; ISBN:9780128022559
v. 188 ; ISBN:9780128022542
v. 190 ; ISBN:9780128023808
v. 191 ; ISBN:9780128022535
v. 193 ; ISBN:9780128048153
v. 196 ; ISBN:9780128048122
v. 197 ; ISBN:9780128048115
v. 198 ; ISBN:9780128048108
v. 199 ; ISBN:9780128120910
v. 200 ; ISBN:9780128120903
v. 201 ; ISBN:9780128120897
v. 202 ; ISBN:9780128120880
v. 203 ; ISBN:9780128120873
v. 204 ; ISBN:9780128120866
v. 205 ; ISBN:9780128152171
v. 206 ; ISBN:9780128152164
v. 207 ; ISBN:9780128152157
v. 208 ; ISBN:9780128152140
v. 209 ; ISBN:9780128171776
v. 210 ; ISBN:9780128171837
v. 211 ; ISBN:9780128174692
v. 212 ; ISBN:9780128174753
v. 213 ; ISBN:9780128209974