Polarization analysis, measurement, and remote sensing IV : 29-31 July 2001, San Diego, USA

Polarization analysis, measurement, and remote sensing IV : 29-31 July 2001, San Diego, USA / Dennis H. Goldstein, David B. Chenault, Walter G. Egan, Michael J. Duggin chairs/editors ; sponsored and published by SPIE--The International Society for Optical Engineering
(Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4481)

配架場所	巻　次	請求記号	登録番号	状　態	利用注記	予約
1F図書		A9/SP/4481	10020895

出版情報	Bellingham, Wash. : SPIE , c2002
本文言語	英語
大きさ	ix, 324 p. : ill. ; 28 cm
著者標目	Society of Photo-optical Instrumentation Engineers Goldstein, Dennis H. Chenault, David B. Egan, Walter G. Duggin, Michael J.
件　名	LCSH:Polarimetry -- Congresses 全ての件名で検索
分　類	LCC:QC443 DC20:535.52/0287
ISBN	0819441953
NCID	BA60635853