Author Information

Uniform Heading:
SPIE Ukraine Chapter
Type of Name:
Corporate
"See From" ref.:
Society of Photo-optical Instrumentation Engineers. Ukraine Chapter
Note:
International Workshop on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, c1994: t.p. (SPIE Ukraine Chapter)
SRC:International Workshop on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 6-7 May 1993, Kiev, Ukraine / Sergei V. Svechnikov, Mikhail Ya. Valakh, chairs/editors ; sponsored by SPIE Ukraine Chapter, Institute of Semiconductor Physics, Academy of Sciences of the Ukraine, Arsenal Central Design Bureau(SPIE--the International Society for Optical Engineering, c1994)
Author ID:
DA09793523


1.

Book

Book
Simon B. Gurevich, Zinovii T. Nazarchuk, Leonid I. Muravsky, editors ; sponsored by SPIE Ukraine Chapter, STCU-Science and technology Center in Ukraine ; organized by SPIE Ukraine Chapter ... [et al.]
Published: Bellingham, Wash. : SPIE--the International Society for Optical Engineering, c2000
Series: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4148
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2.

Book

Book
Marat S. Soskin, Mikhail V. Vasnetsov ; organized by Institute of Physics of the National Academy of Sciences of Ukraine, National Tavrida Vernadsky University (Ukraine), SPIE Ukraine Chapter ; sponsored by Ministry of Science and Technologies of Ukraine ... [et al.]
Published: Bellingham, Wash., USA : SPIE, c2001
Series: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4403
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