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Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China
- フォーマット:
- 図書
- 責任表示:
- Shenghua Ye, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering, COEMA--China Optics & Optoelectronic Manufacturers Association, COS--Chinese Optical Society ; cooperating organizations, National Natural Science Foundation of China ... [et al.]
- 言語:
- 英語
- 出版情報:
- Bellingham, Washington : SPIE, c1998
- 形態:
- xiii, 656 p. : ill. ; 28 cm
- 著者名:
- シリーズ名:
- Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3558 <BA0022700X>
- 書誌ID:
- BA45606215
- ISBN:
- 9780819430199 [0819430196]
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Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China
SPIE--the International Society for Optical Engineering | |