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Test and evaluation of IR detectors and arrays II : 22-23 April 1992, Orlando, Florida

フォーマット:
図書
責任表示:
Forney M. Hoke, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering
言語:
英語
出版情報:
Bellingham, Wash. : The Society, c1992
形態:
vii, 225 p. : ill. ; 28 cm
著者名:
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 1686 <BA0022700X>
書誌ID:
BA20687647
ISBN:
9780819408518 [0819408514]  CiNii Books  Webcat Plus  Google Books
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