Modern Optical testing

Modern Optical testing

フォーマット:

視聴覚資料

責任表示:

presented by James C. Wyant

言語:

英語

出版情報:

Bellingham, Wash. : SPIE,the International Society for Optical Engineering, 1991-1992

形態:

3 videocassettes (340 min.) : sd., col. ; 1/2 in. + 1 course notes

著者名:

書誌ID:

TB00000669

子書誌情報

所蔵情報

タイトルが類似している資料

詳細

その他の標題:	Video short course notes
TTLL:	eng

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1 図書 Imaging through the atmosphere : [seminar] March 22-23, 1976, Reston, Virginia Wyant, James C., Society of Photo-optical Instrumentation Engineers, Society of Photographic Scientists and Engineers, … SPIE	7 図書 Grazing incidence optics for astronomical and laboratory applications : 17-19 August 1987, San Diego, California Bowyer, Stuart, Green, James C., Society of Photo-optical Instrumentation Engineers SPIE--the International Society for Optical Engineering
2 図書 Infrared imaging systems : design, analysis, modeling, and testing X : 7-8 April 1999, Orlando, Florida Holst, Gerald C., Society of Photo-optical Instrumentation Engineers SPIE	8 図書 Design, manufacturing, and testing of planar optical waveguide devices : 1 August 2001 San Diego, USA Society of Photo-optical Instrumentation Engineers, Norwood, Robert A. SPIE--the International Society for Optical Engineering
3 図書 Infrared imaging systems : design, analysis, modeling, and testing XI : 26-27 April 2000, Orlando, USA Holst, Gerald C., Society of Photo-optical Instrumentation Engineers SPIE	9 図書 Infrared and passive millimeter-wave imaging systems : design, analysis, modeling, and testing : 3-5 April 2002, Orland, USA Society of Photo-optical Instrumentation Engineers, Appleby, Roger, Holst, Gerald C., Wikner, David A. SPIE
4 図書 Infrared imaging systems : design, analysis, modeling, and testing IX : 15-16 April 1998, Orlando, USA Holst, Gerald C., Society of Photo-optical Instrumentation Engineers SPIE	10 図書 Optical manufacturing and testing III : 20-23 July 1999, Denver, Colorado Stahl, H. Philip, Society of Photo-optical Instrumentation Engineers SPIE
5 図書 Infrared imaging systems : design, analysis, modeling, and testing XII : 18-19 April 2001, Orlando, USA Holst, Gerald C., Society of Photo-optical Instrumentation Engineers SPIE	11 図書 Optical design and testing : 15-18 October 2002, Shanghai, China Weng, Zhicheng, Sasian, Jose M, Society of Photo-optical Instrumentation Engineers, Chinese Optical Society SPIE
6 図書 Defense, security, cockpit and future displays II : 19-21 April, 2006, Kissimmee, Florida, USA Byrd, James C., Society of Photo-optical Instrumentation Engineers SPIE	12 図書 Technologies for synthetic environments : hardware-in-the-loop testing III : 13-15 April 1998, Orlando, Florida Murrer, Robert Lee, Society of Photo-optical Instrumentation Engineers SPIE