Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado

Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado

フォーマット:

図書

責任表示:

Philip T. C. Chen, Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and pubslished by SPIE--The International Society for Optical Engineering

言語:

英語

出版情報:

Bellingham, Wash. : SPIE, 1999

形態:

vii, 404 p. : ill. ; 28 cm

著者名:

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3784 <BA0022700X>

書誌ID:

BA45732297

ISBN:

9780819432704 [0819432709] (pbk.)

子書誌情報

所蔵情報

タイトルが類似している資料

詳細

注記:	Includes bibliographical references and indexes
TTLL:	eng

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