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Optical manufacturing and testing III : 20-23 July 1999, Denver, Colorado

フォーマット:
図書
責任表示:
H. Philip Stahl, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering
言語:
英語
出版情報:
Bellingham, Wash. : SPIE, c1999
形態:
x, 640 p. : ill. ; 28 cm
著者名:
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3782 <BA0022700X>
書誌ID:
BA45732606
ISBN:
9780819425560 [0819425567]  CiNii Books  Webcat Plus  Google Books
子書誌情報
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Stahl, H. Philip, Society of Photo-optical Instrumentation Engineers

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Chen, Philip T. C., Gu, Zu-Han, Maradudin, A. A., Society of Photo-optical Instrumentation Engineers

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Sasian, Jose M., Society of Photo-optical Instrumentation Engineers

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Hwu, R. Jennifer, Wu, Ke, Society of Photo-optical Instrumentation Engineers

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Fischer, Robert Edward, 1943-, Smith, Warren J., Society of Photo-optical Instrumentation Engineers

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Roggemann, Michael C., Bissonnette, Luc R., Society of Photo-optical Instrumentation Engineers

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Derby, Eddy A., Gordon, Colin G., Vukobratovich, Daniel, Yoder, Paul R., Zweben, Carl H., Society of Photo-optical &hellip;

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Fishell, Wallace G., Society of Photo-optical Instrumentation Engineers

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Nowak, Jerzy, Zając, Marek, Society of Photo-optical Instrumentation Engineers, Politechnika Wrocławska. Instytut Fizyki

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Barnes, William L., Society of Photo-optical Instrumentation Engineers

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