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Polarimetry in astronomy :25-28 August 2002, Waikoloa, Hawaii, USA

フォーマット:
図書
責任表示:
Silvano Fineschi, chairs/editors ; Sponsored and published by SPIE-The International Society for Optical Engineering
言語:
英語
出版情報:
Bellingham, Wash. : SPIE, c2002
形態:
xii, 558 p. : ill. ; 28 cm
著者名:
Fineschi, Silvano <DA0832250X>  
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4843 <BA0022700X>
書誌ID:
BA62658328
ISBN:
9780819446220 [081944622X]  CiNii Books  Webcat Plus  Google Books
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