Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China

Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China

フォーマット:

図書

責任表示:

Shenghua Ye, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering, COEMA--China Optics & Optoelectronic Manufacturers Association, COS--Chinese Optical Society ; cooperating organizations, National Natural Science Foundation of China ... [et al.]

言語:

英語

出版情報:

Bellingham, Washington : SPIE, c1998

形態:

xiii, 656 p. : ill. ; 28 cm

著者名:

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3558 <BA0022700X>

書誌ID:

BA45606215

ISBN:

9780819430199 [0819430196]

子書誌情報

所蔵情報

タイトルが類似している資料

詳細

主題:	Engineering inspection--Automation--Congresses; Optical detectors--Industrial applications--Congresses; Optical measurements--Congresses; Quality control--Optical methods--Automation--Congresses
分類・件名:	LCC : TS156.2 DDC : 670.42/5 LCSH : Engineering inspection -- Automation -- Congresses LCSH : Quality control -- Optical methods -- Automation -- Congresses LCSH : Optical detectors -- Industrial applications -- Congresses LCSH : Optical measurements -- Congresses
LCCN:	99159856
注記:	Includes bibliographical references and author index
TTLL:	eng

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