X-ray multilayers for diffractometers, monochromators, and spectrometers : 17-19 August 1988, San Diego, California

X-ray multilayers for diffractometers, monochromators, and spectrometers : 17-19 August 1988, San Diego, California

フォーマット:

図書

責任表示:

Finn E. Christensen, editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.]

言語:

英語

出版情報:

Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1988

形態:

viii, 271 p. : ill. ; 28 cm

著者名:

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 984 <BA0022700X>

書誌ID:

BA07982154

ISBN:

9780819400192 [081940019X]

子書誌情報

所蔵情報

タイトルが類似している資料

詳細

主題:	Monochromator--Surfaces--Congresses; Spectrometer--Surfaces--Congresses; Thin films, Multilayered--Congresses; X-ray diffractometer--Surfaces--Congresses; X-rays--Congresses
分類・件名:	LCC : QC176.9.M84 DDC : 621.36 LCSH : Thin films, Multilayered -- Congresses LCSH : X-rays -- Congresses LCSH : Monochromator -- Surfaces -- Congresses LCSH : Spectrometer -- Surfaces -- Congresses LCSH : X-ray diffractometer -- Surfaces -- Congresses
LCCN:	88062305
注記:	Includes bibliographies and index
TTLL:	eng

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