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X-ray multilayers for diffractometers, monochromators, and spectrometers : 17-19 August 1988, San Diego, California
- フォーマット:
- 図書
- 責任表示:
- Finn E. Christensen, editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.]
- 言語:
- 英語
- 出版情報:
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1988
- 形態:
- viii, 271 p. : ill. ; 28 cm
- 著者名:
- シリーズ名:
- Proceedings / SPIE -- the International Society for Optical Engineering ; v. 984 <BA0022700X>
- 書誌ID:
- BA07982154
- ISBN:
- 9780819400192 [081940019X]
類似資料:
SPIE-- the international Society for Optical Engineering |
SPIE--the International Society for Optical Engineering |