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Ultraviolet and x-ray detection, spectroscopy and polarimetry III : 19-20 July 1999, Denver, Colorado

フォーマット:
図書
責任表示:
Silvano Fineschi, Bruce E. Woodgate, Randy A. Kimble, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
言語:
英語
出版情報:
Bellingham, Wash. : SPIE, c1999
形態:
vii, 288 p. : ill. ; 28 cm
著者名:
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3764 <BA0022700X>
書誌ID:
BA45717599
ISBN:
9780819432506 [0819432504]  CiNii Books  Webcat Plus  Google Books
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