1.

図書
図書
1. Polarization analysis, measurement, and remote sensing III : 2-4 August 2000, San Diego, USA
David B. Chenault, Michaek J. Duggin, Walter G. Egan, Dennis H. Goldstein, chairs/editors ; sponsored and published by SPIE--The International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE, c2000
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4133
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2.

図書
図書
2. Polarization analysis, measurement, and remote sensing IV : 29-31 July 2001, San Diego, USA
Dennis H. Goldstein, David B. Chenault, Walter G. Egan, Michael J. Duggin chairs/editors ; sponsored and published by SPIE--The International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE, c2002
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4481
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